Quantitative Analysis of Rock Samples by an X-ray Fluorescence Spectrometer (ii)

One of the advantages of X-ray fluorescence XRF analysis is its ability to perform accurate quantitative analysis over a wide range of elements with relative ease. In addition, its high sensitivity makes it ideal for trace elemental analysis. The establishment of analytical conditions for XRF is straightforward, including the determination of spectral line overlap correction factors. As with most analytical techniques, matrix effects (inter-element effects) need to be corrected for when performing quantitative analysis. XRF analysis also requires careful selection of analytical standards to achieve optimum quantitative results. In the first half of this article, quantitative analysis of briquette samples will be summarized. This work was performed with an X-ray spectrometer in collaboration with the Analytical Laboratory at Rigaku Industrial Corporation. Analytical methods for trace analysis of elements such as Nb, Zr, Y, Sr, Rb, Pb, Th, Ni, Ba, Cl, Na and K will be discussed. In the second half, analytical methods for the quantitative analysis of major elements in briquette samples will be summarized. The method discussed is not applicable for every element because of general difficulties encountered with SiO2 and Al2O3 contents. However, these results will also be summarized. SiO2 is the major constituent of most rocks; and, Al2O3 presents analytical difficulties even by wet techniques. Please refer to “Quantitative analysis of rock samples by an X-ray fluorescence spectrometer (1) by Goto and Tatsumi (1994)” for information on the preparation of briquette samples. Trace Elemental Analysis